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Development of Correlative Light and Electron Microscopy to Act as Opportunity for Growth in Failure Analysis Equipment Market, reports TMR

Posted on Sep 23, 2016

The global failure analysis equipment market is consolidated with the top four players accounting for almost 80% of the market. These players are Carl Zeiss SMT GmbH, FEI Company, Hitachi High-Technologies Europe GmbH, and JEOL Ltd. The focus of key players is on developing cost effective equipment. Owing to high initial set up cost, it is difficult for new players to enter the market, states a new report by Transparency Market Research (TMR). Additionally, the shortage of skilled manpower for manufacturing and difficulty in creating a brand name will ensure that the threat of new entrants will remain low. The threat of substitutes will also remain low as the market only faces competition from optical microscopes, which is an internal substitute. 

According to the report, the global failure analysis equipment market is expected to be worth US$7.34 bn by 2019. By equipment, the transmission electron microscopes (TEM) segment will continue to lead and account for 36.22% of the market by 2019. By end use, the semiconductors manufacturing segment, followed by the metallurgy segment is expected to lead. The semiconductors manufacturing segment will account for 23.81% of the global failure analysis equipment market. On the basis of technology, the secondary ion mass spectroscopy (SIMS) segment is the dominant segment of the market, accounting for 28.22% in 2019. Asia Pacific is expected to remain the dominant regional segment in the market accounting for 54.85% of the market.

Use in Nanotechnology and Research-Oriented Educational Programs Driving Demand for Failure Analysis Equipment

The use of nanotechnology is swiftly rising and with it, the demand for failure analysis equipment is also anticipated to grow. This is due to the wide use of failure analysis equipment such as scanning electron microscopes (SEM), transmission electron microscopes (TEM) and dual beam systems (FIB/SEM) among others in advance processing required in the field of nanotechnology. Further, the rise in the standard of living owing to an increase in the disposable income of the people and technological advancements in the medical sector in developing nations such as Brazil, India, Russia and China, are expected to grow in the years to come. This is expected to drive the failure analysis equipment market.

Another factor boosting the demand for these equipment is the increase in the research-oriented educational programs, which take place both in the undergraduate and postgraduate levels. Failure analysis equipment simplifies the process of research and education, thus driving their demand.

High Cost of Equipment to Hinder Adoption of Failure Analysis Equipment

SEM, TEM, and FIB cost above US$4 mn which is why end users are hesitating in investing on these equipment. Comparatively, optical microscopes cost much less. “The high price is especially a problem for the price sensitive regions such as Asia Pacific, where the per capita income is much lower than countries such in North America,” states a TMR analyst. As such, companies are trying to cut down the price for product maintenance and operating costs in order to increase their operating margins and at the same time provide end users the equipment at comparatively lower price than before.

Development of Advanced Technologies to Create Opportunities for Growth in Price Sensitive APAC Region

With the development of advanced technologies such as super-resolution microscopy and correlative light and electron microscopy (CLEM) and the per capita incomes rising in APAC, the adoption rate of these equipment will rise. Moreover, CLEM techniques provide tools for quantitative 3D analysis by adding the third dimension to EM with electron tomography combined with rapid freezing. As such, their demand is expected to rise, thus creating new opportunities in the market.

This information is based on the findings of a report published by Transparency Market Research titled “Failure Analysis Equipment Market - Global Industry Analysis, Size, Share, Growth, Trends, and Forecast 2014 - 2020.”

The global failure analysis equipment market is segmented as follows:

By geography

  • North America
  • Europe
  • Asia Pacific
  • RoW

By equipment

  • Scanning electron microscope (SEM)
  • Transmission electron microscope (TEM)
  • Focused Ion Beam system (FIB)
  • Dual Beam (FIB/SEM) systems

 By technology

  • Transmission electron microscopy
  • Scanning electron microscopy
  • Scanning Transmission electron microscopy (STEM)
  • X-ray imaging
  • Nanoprobing
  • Laser voltage imaging (LVI)
  • Focused ion beam (FIB)
  • Broad ion milling (BIM)
  • Secondary ion mass spectroscopy (SIMS)
  • Energy dispersive X-ray spectroscopy (EDX)
  • Reactive ion etching (RIE)
  • Chemical mechanical planarization (CMP)

 By application

  • Defect localization
  • Defect characterization
  • Others

By customers

  • Fab FA labs
  • Fabless FA labs
  • Specialty labs
  • Others

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